艾思科蓝公众号
SCI期刊JCR分区 |
SCI期刊JCR分区等级:3区
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最新中科院SCI期刊分区 (基础版) |
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最新中科院SCI期刊分区 (升级版) |
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期刊简介
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The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.
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出版信息
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出版商 | Institute of Electrical and Electronics Engineers Inc. |
期刊官网 | http://ieeexplore.ieee.org/xpl/RecentIssue.jsp |
涉及的研究方向 | 工程技术-工程:电子与电气 |
刊期 | Quarterly |
年文章数 | 80 |
出版国家或地区 | UNITED STATES |
是否OA | 否 |
SCI期刊收录coverage | Science Citation Index Expanded (SCIE) Scopus (CiteScore) |
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